N7752A-Agilent HP N7752A 集成双通道可变光衰减器

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Agilent HP N7752A 集成双通道可变光衰减器

详细资料：
主要技术指标

Measurement capability: attenuator
settling time: 20 ms attenuation, 100 ms power
0.1 to 1000 dB/s attenuation transition speed (selectable)
+23 dBm input power
≤ 1.2 dB insertion loss
Measurement capability: power meter
Wavelength range: 1260-1640 nm
Power range: -80 to +10 dBm
Polarization dependence: <0.01 dB
System capability
Two attenuator channels and two power meters in one half-width rack unit
Fully compatible with programs developed using the Agilent 8157x and 8156x modular attenuators
Includes powerful and user-friendly GUI software
Two instrument configurations can be stored and recalled
描述
The Agilent N7752A combines an attenuator with 2 front-panel power meter channels, offering exceptional performance at a low price. The power meters permit measurements from any point in the measurements setup and assist in calibrating power offsets with respect to the attenuator output.

Extension of N77xx-series
The N7752A attenuator is an extension to Agilent''''s high density N77xx-family that establishes a new standard in space-saving fiberoptic instrumentation.

Features and Benefits
Compact instrument combines and integrates multiple functions for setting attenuation and power levels and optical power measurement to reduce CAPEX and floor space.
Fast and precise setting of optical power levels with settling times of 100 ms for improved test throughput.
The power meters support convenient power offset calibration of the attenuators.
Active power control to keep output power constant
The multichannel attenuator sets and measures several ports at the same time and saves significant time characterizing multiport and multichannel components and network equipments.
The instrument can be controlled via LAN and USB, as well as GPIB for compatibility with existing equipment.
An easy-to-use and intuitive graphical user interface software speeds up the integration process.
Applications
Optical transceiver testing
Optical network integration testing

 
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